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Results 1 to 25 of 3590

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Weighted least squares estimation of background in EELS imagingPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1985, Vol 137, Num 1, pp 93-100, issn 0022-2720Article

Optimized acquisition parameters and statistical detection limit in quantitative EELSPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1984, Vol 135, Num 3, pp 295-316, issn 0022-2720Article

Digital filtering in electron energy loss spectroscopy (EELS)HOSOI, J; OIKAWA, T; INOUE, M et al.Journal of electron microscopy. 1985, Vol 34, Num 1, pp 1-7, issn 0022-0744Article

The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurementsYING-YING YANG; EGERTON, R. F.Microscopy research and technique. 1992, Vol 21, Num 4, pp 361-367Article

Image-EELS : simultaneous recording of multiple electron energy-loss spectra from series of electron spectroscopic imagesKÖRTJE, K.-H.Journal of microscopy (Print). 1994, Vol 174, pp 149-159, issn 0022-2720, 3Article

Optimization of the geometric disposition of the deflecting electrodes in HREELS spectrometersMARTEL, R; MCBREEN, P. H.Review of scientific instruments. 1992, Vol 63, Num 5, pp 3007-3012, issn 0034-6748Article

Optimal conditions for the use of correspondence analysis for element determination in EELS imagesGELSEMA, E. S; BECKERS, A. L. D; DE BRUIJN, W. C et al.Journal of microscopy (Print). 1994, Vol 174, pp 161-169, issn 0022-2720, 3Article

Numerical aspects of the deconvolution of angle-integrated electron energy-loss spectraSU, D. S; SCHATTSCHNEIDER, P.Journal of microscopy (Print). 1992, Vol 167, pp 63-75, issn 0022-2720, 1Article

A new variable-angle intermediate-energy low-resolution electron energy loss spectrometerDE SOUZA, G. G. B; DE SOUZA, A. C. A. E.Journal of physics. E. Scientific instruments. 1985, Vol 18, Num 12, pp 1037-1039, issn 0022-3735Article

Reflection electron energy loss spectroscopy: role of the Bethe―Born factorCALLIARI, L; FANCHENKO, S.Surface and interface analysis. 2012, Vol 44, Num 8, pp 1104-1109, issn 0142-2421, 6 p.Conference Paper

The effect of 3d-electron excitation of EELFS and EXAFS above M2,3 edge of 3d-transition metalsVEDRINSKII, R. V; TARANUKHINA, A. I; BUGAEV, L. A et al.Solid state communications. 1994, Vol 91, Num 6, pp 457-460, issn 0038-1098Article

Towards a practical method for EELS quantificationHOFER, F; LUO, B.Ultramicroscopy. 1991, Vol 38, Num 2, pp 159-167, issn 0304-3991Article

A novel, double-focusing spectrometer for translational-energy-loss spectroscopyBEYNON, J. H; BRENTON, A. G; TAYLOR, L. C. E et al.International journal of mass spectrometry and ion processes. 1985, Vol 64, Num 2, pp 237-244, issn 0168-1176Article

A single-stage process for quantifying electron energy-loss spectraSTEELE, J. D; TICHMARSH, J. M; CHAPMAN, J. N et al.Ultramicroscopy. 1985, Vol 17, Num 3, pp 273-276, issn 0304-3991Article

Design of a high-dispersion magnetic spectrometer for EELSYOSHIDA, K; URA, K; MATSUDA, H et al.Optik (Stuttgart). 1985, Vol 71, Num 1, pp 11-14, issn 0030-4026Article

Development of dispersion compensation for use in high-resolution electron-energy-loss spectroscopyKEVAN, S. D; DUBOIS, L. H.Reviews of modern physics. 1984, Vol 55, Num 10, pp 1604-1612, issn 0034-6861Article

Richardson-Lucy deconvolution of reflection electron energy loss spectraHUMMEL, Stefan; GROSS, Alexander; WERNER, Wolfgang S. M et al.Surface and interface analysis. 2009, Vol 41, Num 5, pp 357-360, issn 0142-2421, 4 p.Article

Development, quantitative performance and applications of a parallel electron energy-loss spectrum imaging systemBOTTON, G; L'ESPERANCE, G.Journal of microscopy (Print). 1994, Vol 173, pp 9-25, issn 0022-2720, 1Article

Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometerEGERTON, R. F; YANG, Y.-Y; CHENG, S. C et al.Ultramicroscopy. 1993, Vol 48, Num 3, pp 239-250, issn 0304-3991Article

Electron energy loss spectroscopy with resolution below 1 meVIBACH, H.Journal of electron spectroscopy and related phenomena. 1993, Vol 64-65, pp 819-823, issn 0368-2048Conference Paper

A new background substration for low-energy EELS core edgesTENAILLEAU, H; MARTIN, J. M.Journal of microscopy (Print). 1992, Vol 166, pp 297-306, issn 0022-2720, 3Article

Spatial resolution energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 133-144, issn 0304-3991Conference Paper

A study of an inhomogeneous gradient magnetic field spectrometer with a curvilinear axisXIMEN JIYE; ZHIFENG SHAO.Optik (Stuttgart). 1985, Vol 71, Num 2, pp 73-79, issn 0030-4026Article

Elastic scattering in eels ― fundamental corrections to quantificationBOURDILLON, A. J; STOBBS, W. M.Ultramicroscopy. 1985, Vol 17, Num 2, pp 147-149, issn 0304-3991Article

International workshop on electron energy loss spectroscopy and Imaging (EELSI)KRIVANEK, Ondrej L.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, issn 1154-2799, 166 p.Conference Proceedings

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